ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,045, issued on July 28, was assigned to Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e. V. (Munich). "Ion beam extraction appa... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,046, issued on July 28, was assigned to NuFlare Technology Inc. (Yokohama, Japan). "Method for estimating cathode lifetime of electron gun,... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,047, issued on July 28, was assigned to Clocktower Engineering Inc. (Beverly, Mass.). "Devices and methods for electrostatic ion beam defle... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,048, issued on July 28, was assigned to Applied Materials Inc. (Santa Clara, Calif.). "Managing beam power effects by varying base emissivi... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,049, issued on July 28, was assigned to SAMSUNG ELECTRONICS Co. LTD. (Suwon-si, South Korea). "Ion beam deposition apparatus and ion beam d... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,050, issued on July 28, was assigned to ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH (Heimstetten, Germany). "... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,051, issued on July 28, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Sensing element level circuitry design for electro... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,052, issued on July 28, was assigned to FEI Co. (Hillsboro, Ore.). "Condensate precursors and contaminant purge apparatus and methods" was ... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,053, issued on July 28, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Self-referencing health monitoring system for mult... Read More
ALEXANDRIA, Va., July 28 -- United States Patent no. 12,695,054, issued on July 28, was assigned to Applied Materials Israel Ltd. (Rehovot, Israel). "Precision in stereoscopic measurements using a pr... Read More